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Atomic Force Microscopy Studies of Aluminum Corrosion Inhibition by Adsorbed Self Assembled Monolayers

Published online by Cambridge University Press:  02 July 2020

John F. Richards ,
E. Barry Troughton ,
Richard A. Dennis  and
Phillip E. Russell
John F. Richards
Affiliation:
Materials Science and Engineering, Box 7907, North Carolina State University, Raleigh, NC, 27695
E. Barry Troughton
Affiliation:
Lord Corporation, 405 Gregson Drive, Cary, NC, 27511
Richard A. Dennis
Affiliation:
Lord Corporation, 405 Gregson Drive, Cary, NC, 27511
Phillip E. Russell
Affiliation:
Materials Science and Engineering, Box 7907, North Carolina State University, Raleigh, NC, 27695
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Atomic force microscopy (AFM) studies on the microstructure of the phosphonic acid (PA) / Al (with native oxide) self assembled monolayer (SAM) system (a possible corrosion resistant coating interface monolayer) has been evaluated as a function of molecular chain length and processing conditions (i.e. adsorption time) in previous works. It was apparent from the AFM topography and phase images of the monolayer microstructure that the octadecylphosphonic acid (OPA) monolyer was the most conformal and showed little dependence on adsorption time (for times ≤ 24 hours). It was therefore chosen as the most promising monolayer compound of the PA/A1 system with which to study corrosion inhibiting properties.

In this present work, AFM is used to study the corrosion inhibiting ability of OPA SAMs on aluminum, and also to investigate the “nucleation” and progression of Al corrosion and oxide formation in water at the nanometer level; with and without SAM passivation.

Type
Scanned Probe Microscopies: Technologies, Methodologies, and Applications
Information
Microscopy and Microanalysis , Volume 3 , Issue S2: Proceedings: Microscopy & Microanalysis '97, Microscopy Society of America 55th Annual Meeting, Microbeam Analysis Society 31st Annual Meeting, Histochemical Society 48th Annual Meeting, Cleveland, Ohio, August 10-14, 1997 , August 1997 , pp. 1263 - 1264
Copyright
Copyright © Microscopy Society of America 1997

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References

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