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Analytical TEM Investigations of Si Nanowires grown by the VLS Mechanism from Au Templates

Published online by Cambridge University Press:  07 September 2007

R Schneider ,
A Berger ,
S Christiansen ,
R Scholz ,
T Stelzner ,
G Andrä ,
T Seyller  and
L Ley
R Schneider
Affiliation:
University Karlsruhe and Max Planck Institute of Microstructure Physics,Germany
A Berger
Affiliation:
University Karlsruhe and Max Planck Institute of Microstructure Physics,Germany
S Christiansen
Affiliation:
Max Planck Institute of Microstructure Physics and Martin Luther University Halle-Wittenberg,Germany
R Scholz
Affiliation:
Max Planck Institute of Microstructure Physics,Germany
T Stelzner
Affiliation:
University Jena
G Andrä
Affiliation:
University Jena
T Seyller
Affiliation:
University Erlangen,Germany
L Ley
Affiliation:
University Erlangen,Germany
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Extract

Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

Type
Research Article
Information
Microscopy and Microanalysis , Volume 13 , Issue S03 , September 2007 , pp. 314 - 315
Copyright
Copyright © Microscopy Society of America 2007

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