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Analytical Electron Microscopy of Composite Interfaces

Published online by Cambridge University Press:  02 July 2020

Steven Kim  and
Vinayak P. Dravid
Steven Kim
Affiliation:
Department of Materials Science & Engineering, Northwestern University, Evanston, IL60208
Vinayak P. Dravid
Affiliation:
Department of Materials Science & Engineering, Northwestern University, Evanston, IL60208
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Extract

The fiber/matrix interfaces play a critical role in the mechanical performance of fiber-reinforced ceramic-matrix composites (CMCs). In this vein, the placement of an interphase material between the fiber and matrix phases has received considerable attention. The main purpose of the interphase coating is to enhance toughness of the composite by influencing crack trajectories at the mechanically critical (weak) fiber/coating interface.

This interest in coated-fiber composites has been accompanied by the need for accurate microanalysis of the CMC systems, owing to issues of both morphological and chemical incompatibilities between the dissimilar fiber and coating materials. Consequently, microanalysis has been driven below the micrometer scale, into the length scale of nanometers. Thus, the examination of the fiber/coating interfaces in CMCs falls squarely into the realm of transmission electron microscope (TEM) and scanning transmission electron microscopy (STEM) analyses.

However, the success of TEM/STEM-based microanalysis of CMCs hinges critically on the quality of TEM specimen.

Type
Future of Microscopy: Ceramics, Composites, and Cement
Information
Microscopy and Microanalysis , Volume 5 , Issue S2: Proceedings: Microscopy & Microanalysis '99, Microscopy Society of America 57th Annual Meeting, Microbeam Analysis Society 33rd Annual Meeting, Portland, Oregon August 1-5, 1999 , August 1999 , pp. 784 - 785
Copyright
Copyright © Microscopy Society of America

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References

(1)Faber, K.T., Ann. Rev. Mat. Sci. 27 (1997) 499,CrossRefGoogle Scholar
(2)Marshall, D.B.et al., Key Eng. Mat. 127-131 (1997) 27,Google Scholar
(3)Cinibulk, M.K.et al., J. Amer. Ceram. Soc. 79 (1996) 2481,CrossRefGoogle Scholar
(4)Steven, Kim and V.P., Dravid, submitted to J. of Micro., February 1999.Google Scholar
(5)Goettler, R.W.et al., Proc. of the 21st Conf. on Comp. (ed. by Singh, J.P., Amer. Ceram. Soc. Publ., OH), Vol. 18 (1997) 279.Google Scholar