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Analysis of Selected Area Diffraction Patterns With Winjade

Published online by Cambridge University Press:  02 July 2020

S. D. Walck  and
P. Ruzakowski-Athey
S. D. Walck
Affiliation:
PPG Industries, Glass Technology Center, Pittsburgh, PA, 15238
P. Ruzakowski-Athey
Affiliation:
PPG Industries, Glass Technology Center, Pittsburgh, PA, 15238
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The analysis of Selected Area Diffraction (SAD) patterns that are collected from a single phase material having sufficient crystallites to provide continuous rings is relatively straightforward. However, when this condition is not met and there may be several phases present having rings of a spotty nature, the pattern is complex and can be quite difficult to analyze manually because of the vast number of discrete spots. WinJade from MDI is an X-ray diffraction (XRD) analysis program with an Electron Diffraction Program Module (EDPM) that can be used to aid in the analysis of SAD patterns. The EDPM produces Integrated Circular Density Plots (ICDP), which are one-dimensional intensity profiles plotted as a function of equivalent XRD 20 values or crystal d-spacings. These ICDP's can be overlayed with XRD patterns or with reference lines from the NIST and JCPDS crystalline databases for direct comparisons.

Type
Electron Diffraction and Scattering
Information
Microscopy and Microanalysis , Volume 4 , Issue S2: Proceedings: Microscopy & Microanalysis '98, Microscopy Society of America 56th Annual Meeting, Microbeam Analysis Society 32nd Annual Meeting, Atlanta, Georgia July 12-16, 1998 , July 1998 , pp. 342 - 343
Copyright
Copyright © Microscopy Society of America

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References

1. WinJade version 3.1, Materials Data, Incorporated, Livermore, CA., [email protected]Google Scholar

2. NIST Crystal Database and JCPDS, International Centre for Diffraction Data, Newton Square, PA.Google Scholar