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An Application of a Thin Film Preparation Apparatus with a Broad Ar Ion Beam (Ion Slicer) to Corrosion of a Gold Plated Copper Alloy

Published online by Cambridge University Press:  05 August 2007

N Endo ,
H Takahashi ,
H Nishioka  and
M Kersker
N Endo
Affiliation:
JEOL Ltd
H Takahashi
Affiliation:
JEOL Ltd
H Nishioka
Affiliation:
JEOL Ltd
M Kersker
Affiliation:
JEOL USA
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Type
Research Article
Information
Microscopy and Microanalysis , Volume 13 , Issue S02 , August 2007 , pp. 1092 - 1093
Copyright
© 2007 Microscopy Society of America

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