Hostname: page-component-586b7cd67f-t7fkt Total loading time: 0 Render date: 2024-11-27T04:48:00.577Z Has data issue: false hasContentIssue false
  • English
  • Français

AES and SEM/EDS Analysis of Silvered Teflon Laminates of Optical Solar Reflector

Published online by Cambridge University Press:  02 July 2020

Len Wang ,
Robert Kiwak ,
Lonny Kauder  and
Gregory Greer
Len Wang
Affiliation:
Unisys Federal System at the Materials Engineering Branch, GSFC, NASA Greenbelt, MD20771
Robert Kiwak
Affiliation:
Unisys Federal System at the Materials Engineering Branch, GSFC, NASA Greenbelt, MD20771
Lonny Kauder
Affiliation:
EOS-PM Project, GSFC, NASA Greenbelt, MD20771
Gregory Greer
Affiliation:
EOS-PM Project, GSFC, NASA Greenbelt, MD20771
Get access

Extract

The Optical Solar Reflector (OSR) of Earth Observing System-PM (EOS-PM) is made of a flexible function layer of silvered Teflon/Inconel/Kapton laminate bonded to a honeycomb panel. After having been thermal cycled in vacuum, the laminate/panel was irradiated in air with UV at 2.2 equivalent suns intensity for 500 hours. Severe darkening was observed in areas exposed to UV but little or no darkening occurred in adjacent but shaded areas. Drastic increase of absorptance was observed-due to the darkening.

In order to investigate the cause of the degradation, test samples were irradiated at different configurations for 1000 equivalent sun hours (ESH). These samples were freestanding laminates and irradiated in vacuum and air, respectively. No darkening was observed on the sample that was irradiated in vacuum. Severe darkening was observed on the sample that was irradiated in the air. A laminate sample was irradiated in dry nitrogen for 1000 ESR and found no darkening either.

Type
Irradiation and Implantation Effects in Materials
Information
Microscopy and Microanalysis , Volume 5 , Issue S2: Proceedings: Microscopy & Microanalysis '99, Microscopy Society of America 57th Annual Meeting, Microbeam Analysis Society 33rd Annual Meeting, Portland, Oregon August 1-5, 1999 , August 1999 , pp. 766 - 767
Copyright
Copyright © Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)