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Advances in the technology of silicon drift detectors (SDD) and multiple element SDD

Published online by Cambridge University Press:  03 August 2008

R Terborg  and
M Rohde
R Terborg
Affiliation:
Bruker AXS Microanalysis GmbH, Germany
M Rohde
Affiliation:
Bruker AXS Microanalysis GmbH, Germany
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 1166 - 1167
Copyright
© 2008 Microscopy Society of America

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