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Aberration-Corrected Transmission Electron Microscopic Study of the Central Dark Line Defect in Human Tooth Enamel Crystals

Published online by Cambridge University Press:  15 September 2016

José Reyes-Gasga ,
Joseph Hémmerlé  and
Etienne F. Brès
José Reyes-Gasga*
Affiliation:
Instituto de Física, UNAM. Circuito de la Investigación s/n, Ciudad Universitaria. 04510 Coyoacan, México, D.F., México
Joseph Hémmerlé
Affiliation:
INSERM UMR_S 1121, Faculté de Chirurgie Dentaire, Université de Strasbourg, 67085 Strasbourg, France
Etienne F. Brès
Affiliation:
UMET, Bâtiment C6, Université de Lille 1—Sciences et Technologies, 59650 Villeneuve d’Ascq, France
*
*Corresponding author. [email protected]
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Abstract

Angstrom resolution images of human tooth enamel (HTE) crystallites were obtained using aberration-corrected high-resolution transmission electron microscopy and atomic-resolution scanning transmission electron microscopy in the modes of bright field, annular dark field, and high-angle annular dark-field. Images show that the central dark line (CDL) defect observed around the center of the HTE crystals is a site for caries formation in the HTE and has a thickness of ~0.2 nm. Results also suggest that the CDL goes through one of the OH− planes.

Keywords

hydroxyapatitehuman tooth enamel crystalscentral dark line defectCs-corrected high-resolution transmission electron microscopyatomic resolution high-angle annular dark-field scanning transmission electron microscopy
Type
Biological Applications
Information
Microscopy and Microanalysis , Volume 22 , Issue 5 , October 2016 , pp. 1047 - 1055
Copyright
© Microscopy Society of America 2016 

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