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Aberration Corrected Zernike Phase Contrast TEM

Published online by Cambridge University Press:  23 November 2012

H. Iijima ,
S. Motoki ,
F. Hosokawa  and
Y. Ohkura
H. Iijima
Affiliation:
JEOL LTD., Tokyo, Japan
S. Motoki
Affiliation:
JEOL LTD., Tokyo, Japan
F. Hosokawa
Affiliation:
JEOL LTD., Tokyo, Japan
Y. Ohkura
Affiliation:
JEOL LTD., Tokyo, Japan
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 492 - 493
Copyright
Copyright © Microscopy Society of America 2012

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