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The 50 mm2 SDD: One Detector Does It All

Published online by Cambridge University Press:  05 August 2007

S Barkan
Affiliation:
SII NanoTechnology USA Inc
V Saveliev
Affiliation:
SII NanoTechnology USA Inc
C Tull
Affiliation:
SII NanoTechnology USA Inc
L Feng
Affiliation:
SII NanoTechnology USA Inc
M Takahashi
Affiliation:
SII NanoTechnology USA Inc
N Matsumori
Affiliation:
SII NanoTechnology USA Inc
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Type
Research Article
Copyright
© 2007 Microscopy Society of America

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