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3D non-destructive grain orientation mapping of polycrystalline materials using 3D-XRD and TEM

Published online by Cambridge University Press:  23 November 2012

X. Huang ,
H.F. Poulsen ,
S. Schmidt ,
H.H. Liu  and
A. Godfrey
X. Huang
Affiliation:
Technical University of Denmark, Roskilde, Denmark
H.F. Poulsen
Affiliation:
Technical University of Denmark, Roskilde, Denmark
S. Schmidt
Affiliation:
Technical University of Denmark, Roskilde, Denmark
H.H. Liu
Affiliation:
California Institute of Technology, Pasadena, CA
A. Godfrey
Affiliation:
Tsinghua University, Beijing, China
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 728 - 729
Copyright
Copyright © Microscopy Society of America 2012

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