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Aberration-Corrected Transmission Electron Microscopy Reveals Nanoscale Disorder in Bismuth Ferrite Single Crystals

Published online by Cambridge University Press:  27 August 2014

K. Urban ,
C. L. Jia ,
L. Jin ,
S. B. Mi ,
M. Alexe  and
D. Hesse
K. Urban
Affiliation:
Peter Grünberg Institute & Ernst Ruska Center, Research Center Jülich, D-52425 Jülich, Germany
C. L. Jia
Affiliation:
Peter Grünberg Institute & Ernst Ruska Center, Research Center Jülich, D-52425 Jülich, Germany International Center for Dielectric Research, Xi’an Jiaotong University, Xi’an 710049, China
L. Jin
Affiliation:
Peter Grünberg Institute & Ernst Ruska Center, Research Center Jülich, D-52425 Jülich, Germany
S. B. Mi
Affiliation:
International Center for Dielectric Research, Xi’an Jiaotong University, Xi’an 710049, China
M. Alexe
Affiliation:
Department of Physics, University of Warwick, Coventry CV4 7AL, United Kingdom
D. Hesse
Affiliation:
Max Planck Institute of Microstructure Physics, Weinberg 2, D-06120 Halle, Germany

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 938 - 939
Copyright
Copyright © Microscopy Society of America 2014 

References

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