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Aberration-Corrected STEM

Published online by Cambridge University Press:  26 July 2009

NJ Bacon ,
GJ Corbin ,
N Dellby ,
P Hrncirik ,
O Krivanek ,
M Murfitt ,
CS Own  and
Z Szilagyi
NJ Bacon
Affiliation:
Nion Co
GJ Corbin
Affiliation:
Nion Co
N Dellby
Affiliation:
Nion Co
P Hrncirik
Affiliation:
Nion Co
O Krivanek
Affiliation:
Nion Co
M Murfitt
Affiliation:
Nion Co
CS Own
Affiliation:
Nion Co
Z Szilagyi
Affiliation:
Nion Co

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Information
Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 1462 - 1463
Copyright
Copyright © Microscopy Society of America 2009