Hostname: page-component-586b7cd67f-2brh9 Total loading time: 0 Render date: 2024-11-26T09:52:44.315Z Has data issue: false hasContentIssue false
  • English
  • Français

Aberration-Corrected Four-Detector STEM-EDS Analysis of Embedded Nanoclusters

Published online by Cambridge University Press:  27 August 2014

Chad M. Parish  and
Michael K. Miller

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 568 - 569
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Miller, M. K.and Parish, C. M. Mater. Sci Tech., 27[4] (2011) p. 729.Google Scholar
[2] Egerton, R. F., et al., Ultramicrosc., 110 (2010) p. 991.Google Scholar
[3] Parish, C. M.and Miller, M. K. Microsc. Microan., in press.Google Scholar
[4] Kotula, P. G., et al., Microsc. Microan., 18[4] (2012) p. 691.Google Scholar
[5] Kotula, P. G., et al., Microsc. Microan., 9[1] (2003) p. 1.Google Scholar
[6] Research sponsored by the Materials Sciences and Engineering Division, Office of Basic Energy Sciences, U.S. Department of Energy. We acknowledge the use of the Analytical Instrumentation.Google Scholar