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Aberration Corrector Tuning with Machine-Learning-Based Emittance Measurements and Bayesian Optimization

Published online by Cambridge University Press:  30 July 2021

Chenyu Zhang ,
Zhaslan Baraissov ,
Cameron Duncan ,
Adi Hanuka ,
Auralee Edelen ,
Jared Maxson  and
David Muller
Chenyu Zhang
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, New York, United States
Zhaslan Baraissov
Affiliation:
School of Applied and Engineering Physics, Cornell University, United States
Cameron Duncan
Affiliation:
Department of Physics, Cornell University, United States
Adi Hanuka
Affiliation:
SLAC National Accelerator Laboratory, United States
Auralee Edelen
Affiliation:
SLAC National Accelerator Laboratory, United States
Jared Maxson
Affiliation:
Department of Physics, Cornell University, United States
David Muller
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA, Ithaca, New York, United States

Abstract

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Type
Full System and Workflow Automation for Enabling Big Data and Machine Learning in Electron Microscopy
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 810 - 812
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Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

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Funded by the Center for Bright Beams, an NSF STC (NSF PHY-1549132).Google Scholar