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Aberration Corrected High Angle Annular Dark Field (HAADF) Scanning Transmission Electron Microscopy (STEM) and In Situ Transmission Electron Microscopy (TEM) Study of Transition Metal Dichalcogenides (TMDs)

Published online by Cambridge University Press:  23 September 2015

Jinguo Wang ,
Ning Lu ,
Juan Pablo Oviedo ,
Xin Peng ,
Guoda Lian  and
Moon J. Kim
Jinguo Wang
Affiliation:
Department of Materials Science and Engineering, The University of Texas at Dallas, Richardson, Texas 75080, USA
Ning Lu
Affiliation:
Department of Materials Science and Engineering, The University of Texas at Dallas, Richardson, Texas 75080, USA
Juan Pablo Oviedo
Affiliation:
Department of Materials Science and Engineering, The University of Texas at Dallas, Richardson, Texas 75080, USA
Xin Peng
Affiliation:
Department of Materials Science and Engineering, The University of Texas at Dallas, Richardson, Texas 75080, USA
Guoda Lian
Affiliation:
Department of Materials Science and Engineering, The University of Texas at Dallas, Richardson, Texas 75080, USA
Moon J. Kim
Affiliation:
Department of Materials Science and Engineering, The University of Texas at Dallas, Richardson, Texas 75080, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 431 - 432
Copyright
Copyright © Microscopy Society of America 2015 

References

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[3] Oviedo, J. P., KC, S., Lu, N., Wang, J.G., Cho, K. J., Wallace, R. M. & Kim, M. J. ACS Nano (2015). Article ASAP.Google Scholar
[4] This work is supported in part by the SWAN Center, a SRC center sponsored by the Nanoelectronics Research Initiative and NIST; by the Center for Low Energy Systems Technology (LEAST), one of six centers of STARnet, a Semiconductor Research Corporation program sponsored by MARCO and DARPA; and by the Louis Beecherl, Jr. endowment funds..Google Scholar