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7 nm Spatial Resolution in Soft X-ray Microscopy

Published online by Cambridge University Press:  10 August 2018

Benedikt Rösner ,
Frieder Koch ,
Florian Döring ,
Vitaliy A. Guzenko ,
Markus Meyer ,
Joshua L. Ornelas ,
Andreas Späth ,
Rainer H. Fink ,
Stefan Stanescu  and
Sufal Swaraj
...Show all authors
Benedikt Rösner*
Affiliation:
Paul Scherrer Institut, 5232Villigen PSI, Switzerland
Frieder Koch
Affiliation:
Paul Scherrer Institut, 5232Villigen PSI, Switzerland
Florian Döring
Affiliation:
Paul Scherrer Institut, 5232Villigen PSI, Switzerland
Vitaliy A. Guzenko
Affiliation:
Paul Scherrer Institut, 5232Villigen PSI, Switzerland
Markus Meyer
Affiliation:
Department Chemistry and Pharmacy, FAU Erlangen-Nürnberg, Egerlandstr. 3, 91058Erlangen, Germany
Joshua L. Ornelas
Affiliation:
Department Chemistry and Pharmacy, FAU Erlangen-Nürnberg, Egerlandstr. 3, 91058Erlangen, Germany
Andreas Späth
Affiliation:
Department Chemistry and Pharmacy, FAU Erlangen-Nürnberg, Egerlandstr. 3, 91058Erlangen, Germany
Rainer H. Fink
Affiliation:
Department Chemistry and Pharmacy, FAU Erlangen-Nürnberg, Egerlandstr. 3, 91058Erlangen, Germany
Stefan Stanescu
Affiliation:
Synchrotron SOLEIL, L’ormes des Merisiers, Saint Aubin BP-48, 91192, Gif-Sur-Yvette Cedex, France
Sufal Swaraj
Affiliation:
Synchrotron SOLEIL, L’ormes des Merisiers, Saint Aubin BP-48, 91192, Gif-Sur-Yvette Cedex, France
Rachid Belkhou
Affiliation:
Synchrotron SOLEIL, L’ormes des Merisiers, Saint Aubin BP-48, 91192, Gif-Sur-Yvette Cedex, France
Benjamin Watts
Affiliation:
Paul Scherrer Institut, 5232Villigen PSI, Switzerland
Jörg Raabe
Affiliation:
Paul Scherrer Institut, 5232Villigen PSI, Switzerland
Christian David
Affiliation:
Paul Scherrer Institut, 5232Villigen PSI, Switzerland
*
* Benedikt Rösner, [email protected]

Abstract

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Information
Microscopy and Microanalysis , Volume 24 , Supplement S2: Proceedings of the 14th International Conference on X-ray Microscopy (XRM2018) , August 2018 , pp. 270 - 271
Copyright
© Microscopy Society of America 2018 

References

[1] Mimura, H, Handa, S, Kimura, T, et al, Nat Phys 6 2010) p. 122.CrossRefGoogle Scholar
[2] Mohacsi, I, Vartiainen, I, Rosner, B, et al, Sci Rep 7 2017) p. 43624 [.CrossRefGoogle Scholar
[3] Doring, F, Robisch, A L, Eberl, C, et al, Opt Express 21 2013) p. 19311.CrossRefGoogle Scholar
[4] Morgan, A J, Prasciolu, M, Andrejczuk, A, et al, Sci Rep 5 2015) p. 9892.CrossRefGoogle Scholar
[5] Bajt, S, Prasciolu, M, Fleckenstein, H, et alLight-Sci Appl accepted 2017) p..Google Scholar
[6] Raabe, J, Tzvetkov, G, Flechsig, U, et al, Rev Sci Instrum 79 2008) p. 113704.CrossRefGoogle Scholar
[7] Belkhou, R, Stanescu, S, Swaraj, S, et al, J Synchrotron Rad 22 2015) p. 968.CrossRefGoogle Scholar
[8] Jefimovs, K, Vila-Comamala, J, Pilvi, T, et al, Phys Rev Lett 99 2007) p. 264801.CrossRefGoogle Scholar
[9] Vila-Comamala, J, Jefimovs, K, Raabe, J, et al, Ultramicroscopy 109 2009) p. 1360.CrossRefGoogle Scholar
[10] Vila-Comamala, J, Gorelick, S, Farm, E, et al, Opt Express 19 2011) p. 175.CrossRefGoogle Scholar
[11] Rosner, B, Koch, F, Doring, F, et al, Microelectron Eng 191 2018) p. 91.CrossRefGoogle Scholar
[12] van Heel, M Schatz, M J Struct Biol 151 2005) p. 250.CrossRefGoogle Scholar