Hostname: page-component-78c5997874-8bhkd Total loading time: 0 Render date: 2024-11-04T21:23:04.899Z Has data issue: false hasContentIssue false
  • English
  • Français

4D-STEM Imaging With the pnCCD (S)TEM-Camera

Published online by Cambridge University Press:  23 September 2015

M. Simson ,
H. Ryll ,
H. Banba ,
R. Hartmann ,
M. Huth ,
S. Ihle ,
L. Jones ,
Y. Kondo ,
K. Muller  and
P.D. Nellist
...Show all authors
M. Simson
Affiliation:
PNDetector GmbH, SckellstraBe 3, 81667 Munchen, Germany
H. Ryll
Affiliation:
PNSensor GmbH, Otto-Hahn-Ring 6, 81739 Munchen, Germany
H. Banba
Affiliation:
JEOL Ltd.,3-1-2 Musashino Akishima Tokyo 196-8558, Japan
R. Hartmann
Affiliation:
PNSensor GmbH, Otto-Hahn-Ring 6, 81739 Munchen, Germany
M. Huth
Affiliation:
PNSensor GmbH, Otto-Hahn-Ring 6, 81739 Munchen, Germany
S. Ihle
Affiliation:
PNSensor GmbH, Otto-Hahn-Ring 6, 81739 Munchen, Germany
L. Jones
Affiliation:
Department of Materials, University of Oxford, 13 Parks Road, Oxford OX13PH, UK
Y. Kondo
Affiliation:
JEOL Ltd.,3-1-2 Musashino Akishima Tokyo 196-8558, Japan
K. Muller
Affiliation:
Universitat Bremen, Otto-Hahn-Allee 1, 28359 Bremen, Germany
P.D. Nellist
Affiliation:
Department of Materials, University of Oxford, 13 Parks Road, Oxford OX13PH, UK
R. Sagawa
Affiliation:
JEOL Ltd.,3-1-2 Musashino Akishima Tokyo 196-8558, Japan
J. Schmidt
Affiliation:
PNSensor GmbH, Otto-Hahn-Ring 6, 81739 Munchen, Germany
H. Soltau
Affiliation:
PNDetector GmbH, SckellstraBe 3, 81667 Munchen, Germany
L. Striider
Affiliation:
PNSensor GmbH, Otto-Hahn-Ring 6, 81739 Munchen, Germany
H. Yang
Affiliation:
Department of Materials, University of Oxford, 13 Parks Road, Oxford OX13PH, UK

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 2211 - 2212
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Ryll, H., et al., Microscopy and Microanalysis 19 (2013). p. 1160–1161.Google Scholar
[2] Rodenburg, J.M., McCallum, B.C. & Nellist, P.D., Ultramicroscopy. 48 (1993) 304–314.CrossRefGoogle Scholar
[3] Yang, H., et al., Ultramicroscopy. doi:10.1016/j.ultramic.2014.10.013.Google Scholar
[4] Muller, K., et al., Appl. Phys. Lett. 101 (2012). p. 2121101–2121104.Google Scholar