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4D-STEM: Combining Pair Distribution Mapping and Multivariate Statistic Analysis to Quantify Structures in Complex Nanoscale Glasses

Published online by Cambridge University Press:  30 July 2021

Xiaoke Mu ,
Leyi Chen  and
Christian Kuebel
Xiaoke Mu
Affiliation:
Karlsruhe Institute of Technology, Germany
Leyi Chen
Affiliation:
Karlsruhe Institute of Technology, Germany
Christian Kuebel
Affiliation:
Karlsruhe Institute of Technology, Eggenstein-Leopoldshafen, Baden-Wurttemberg, Germany

Abstract

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Type
Diffraction Imaging Across Disciplines
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 1788 - 1790
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Egami, T., Billinge, S. J., Mater. Today. 6, 57 (2003)CrossRefGoogle Scholar
Voyles, P. M. and Muller, D. A., Ultramicroscopy 93, 147 (2002).CrossRefGoogle Scholar
Gibson, J. M., et al. , Phys. Rev. Lett. 105, 1 (2010).CrossRefGoogle Scholar
Mu, X. et al. , Ultramicroscopy 168, 1 (2016).CrossRefGoogle Scholar
Mu, X., et al. , Microscopy, 68(4), 301-309, (2019).Google Scholar
Hyvärinen, A. and Oja, E., Neural Netw. 13, 411 (2000).Google Scholar
Mu, X., et al. , Adv. Mater. (2021) 2007267.CrossRefGoogle Scholar
Mu, X. et al. , Acta Mat. (2021) submitted.Google Scholar