Hostname: page-component-586b7cd67f-vdxz6 Total loading time: 0 Render date: 2024-11-26T18:40:32.001Z Has data issue: false hasContentIssue false
  • English
  • Français

A 4D STEM-in-SEM Analysis of Hexagonal Boron Nitride

Published online by Cambridge University Press:  30 July 2021

Jason Holm  and
Elisabeth Mansfield
Jason Holm
Affiliation:
NIST, Boulder, Colorado, United States
Elisabeth Mansfield
Affiliation:
NIST, Boulder, Colorado, United States

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Advances in Analytical STEM-in-SEM
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 1824 - 1825
Check for updates
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Zastro, M., Nature, 2019 (572) 429-432.CrossRefGoogle Scholar
Caplins, B. W., et al. , Ultramicroscopy, 2020 (291) 113137.CrossRefGoogle Scholar
Trade names and company products identified in the text do not imply recommendation or endorsement by NIST, nor do they imply that the products are best suited for the purpose.Google Scholar