No CrossRef data available.
Article contents
4-D STEM Analyses of Cylindrical Specimens for Atom Probe Tomography
Published online by Cambridge University Press: 30 July 2021
Abstract
An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
- Type
- Advanced Application of Atom Probe Tomography: Specimen preparation, Instrumentation, and Data analysis
- Information
- Copyright
- Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America
References
Ceguerra, A., Breen, A., Cairney, J., Ringer, S. & Gorman, B. (2021). Integrative Atom Probe Tomography using STEM-Centric Atom Placement as a Step Towards Atomic-Scale Tomography. MICROSCOPY AND MICROANALYSIS 27, 140–148.CrossRefGoogle Scholar
Kelly, T. F., Gorman, B. P. & Ringer, S. P. (2021). Atomic Scale Analytical Tomography. Cambridge University Press.Google Scholar
Clausen, A., Weber, D., Ruzaeva, K., Migunov, V., Baburajan, A., Bahuleyan, A., Caron, J., Chandra, R., Dey, S., Halder, S., Levin, B. D. A., Nord, M., Ophus, C., Peter, S., Schyndel van, J., Shin, J., Sunku, S., Müller-Caspary, K. & Dunin-Borkowski, R. E. (2020). LiberTEM/LiberTEM: 0.5.1. Zenodo https://zenodo.org/record/3982290#.X4364EJKhTYGoogle Scholar
Padgett, E., Holtz, M. E., Cueva, P., Shao, Y.-T., Langenberg, E., Schlom, D. G. & Muller, D. A. (2020). The exit-wave power-cepstrum transform for scanning nanobeam electron diffraction: robust strain mapping at subnanometer resolution and subpicometer precision. Ultramicroscopy 214, 112994.CrossRefGoogle ScholarPubMed
This work was funded by the Laboratory for Physical Science under contract #H98230-19-C-0428Google Scholar
You have
Access