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4D Analytical STEM with the pnCCD

Published online by Cambridge University Press:  01 August 2018

M. Huth ,
M. Simson ,
R. Ritz ,
H. Ryll ,
G.T. Martinez ,
J. Lozano ,
P.G. Bruce ,
P.D. Nellist ,
R. Sagawa  and
Y. Kondo
...Show all authors
M. Huth
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, Munchen, Germany.
M. Simson
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, Munchen, Germany.
R. Ritz
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, Munchen, Germany.
H. Ryll
Affiliation:
PNSensor GmbH, Otto-Hahn-Ring 6, Munchen, Germany.
G.T. Martinez
Affiliation:
Department of Materials, University of Oxford, Oxford, UK.
J. Lozano
Affiliation:
Department of Materials, University of Oxford, Oxford, UK.
P.G. Bruce
Affiliation:
Department of Materials, University of Oxford, Oxford, UK.
P.D. Nellist
Affiliation:
Department of Materials, University of Oxford, Oxford, UK.
R. Sagawa
Affiliation:
JEOL Ltd., 3-1-2 Musashino Akishima Tokyo, Japan.
Y. Kondo
Affiliation:
JEOL Ltd., 3-1-2 Musashino Akishima Tokyo, Japan.
H. Soltau
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, Munchen, Germany.

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 220 - 221
Copyright
© Microscopy Society of America 2018 

References

[1] Ryll, H., et al, Journal of Instrumentation 11 2016.Google Scholar
[2] Schmidt, J., et al, Journal of Instrumentation 11 2016.Google Scholar