Hostname: page-component-cd9895bd7-gbm5v Total loading time: 0 Render date: 2024-12-24T01:33:12.025Z Has data issue: false hasContentIssue false
  • English
  • Français

3-Dimensional Nanoscale Structural Characterization of Magnetic Tunnel Junction

Published online by Cambridge University Press:  26 July 2009

Y Liu ,
A Petford-Long ,
D Schreiber ,
Y-S Choi ,
D Djayaprawira  and
D Seidman
Y Liu
Affiliation:
Argonne National Laboratory
A Petford-Long
Affiliation:
Argonne National Laboratory
D Schreiber
Affiliation:
Argonne National Laboratory
Y-S Choi
Affiliation:
Canon ANELVA Corp,Japan
D Djayaprawira
Affiliation:
Canon ANELVA Corp,Japan
D Seidman
Affiliation:
Northwestern University

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Information
Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 1248 - 1249
Copyright
Copyright © Microscopy Society of America 2009