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3-D X-ray Microscopy using a Laboratory Source

Published online by Cambridge University Press:  01 August 2004

Michael Feser ,
Fred Duewer ,
Steve Wang ,
David Scott ,
Alan Lyon  and
Wenbing Yun
Michael Feser
Affiliation:
Xradia Inc., Concord, California
Fred Duewer
Affiliation:
Xradia Inc., Concord, California
Steve Wang
Affiliation:
Xradia Inc., Concord, California
David Scott
Affiliation:
Xradia Inc., Concord, California
Alan Lyon
Affiliation:
Xradia Inc., Concord, California
Wenbing Yun
Affiliation:
Xradia Inc., Concord, California
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 10 , Issue S02 , August 2004 , pp. 1036 - 1037
Copyright
© 2004 Microscopy Society of America

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