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3D Imaging of Si and Er Nanoclusters in Er Doped SiO1.5 Films by STEM Tomography

Published online by Cambridge University Press:  26 July 2009

P Li ,
X Wang ,
M Malac ,
R Egerton ,
A Meldrum ,
F Lenz ,
X Liang  and
J Wang
P Li
Affiliation:
National Institute for Nanotechnology,Canada
X Wang
Affiliation:
National Institute for Nanotechnology,Canada
M Malac
Affiliation:
National Institute for Nanotechnology,Canada
R Egerton
Affiliation:
National Institute for Nanotechnology,Canada
A Meldrum
Affiliation:
University of Alberta,Canada
F Lenz
Affiliation:
University of Alberta,Canada
X Liang
Affiliation:
University of Alberta,Canada
J Wang
Affiliation:
National Institute for Nanotechnology,Canada

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Information
Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 1256 - 1257
Copyright
Copyright © Microscopy Society of America 2009