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3D Crystallographic Imaging Using Laboratory-Based Diffraction Contrast Tomography (DCT)

Published online by Cambridge University Press:  23 September 2015

A. Merkle ,
C. Holzner ,
M. Feser ,
S. McDonald ,
P. Withers ,
W. Harris ,
E. Lauridsen ,
P. Reischig ,
H. Poulsen  and
L. Lavery
A. Merkle
Affiliation:
Carl Zeiss X-ray Microscopy, Inc., Pleasanton, CAUSA
C. Holzner
Affiliation:
Carl Zeiss X-ray Microscopy, Inc., Pleasanton, CAUSA
M. Feser
Affiliation:
Carl Zeiss X-ray Microscopy, Inc., Pleasanton, CAUSA
S. McDonald
Affiliation:
Manchester X-ray Imaging Facility, School of Materials, University of Manchester, Manchester M13 9PL, UK
P. Withers
Affiliation:
Manchester X-ray Imaging Facility, School of Materials, University of Manchester, Manchester M13 9PL, UK
W. Harris
Affiliation:
Carl Zeiss X-ray Microscopy, Inc., Pleasanton, CAUSA
E. Lauridsen
Affiliation:
Xnovo Technology ApS, 4600, K0ge, Denmark
P. Reischig
Affiliation:
Xnovo Technology ApS, 4600, K0ge, Denmark
H. Poulsen
Affiliation:
Xnovo Technology ApS, 4600, K0ge, Denmark
L. Lavery
Affiliation:
Carl Zeiss X-ray Microscopy, Inc., Pleasanton, CAUSA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 603 - 604
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Merkle, A. P., et al., Ascent of 3D X-ray Microscopy in the Laboratory. Microscopy Today 21 (2013). p. 10.CrossRefGoogle Scholar
[2] Maire, E. & Withers, P., Quantitative X-ray tomography. International Materials Review 59 (2014). p. 1.CrossRefGoogle Scholar
[3] "Electron Backscatter Diffraction in Materials Science (ed Schwartz, A. et al., Springer US (2009)CrossRefGoogle Scholar
[4] Ludwig, W., et al., X-ray diffraction contrast tomography: a novel technique for three-dimensional grain mapping of polycrystals. 1. Direct beam case. J. Appl. Crystallogr 41 (2008). p. 302–309.CrossRefGoogle Scholar