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20-kV Diffractive Imaging of Graphene by using an SEM-based Dedicated Microscope

Published online by Cambridge University Press:  23 September 2015

Osamu Kamimura ,
Takashi Dobashi ,
Yosuke Maehara ,
Ryo Kitaura ,
Hisanori Shinohara  and
Kazutoshi Gohara
Osamu Kamimura
Affiliation:
Central Research Laboratory, Hitachi, Ltd., Kokubunji-shi, Tokyo, Japan
Takashi Dobashi
Affiliation:
Central Research Laboratory, Hitachi, Ltd., Kokubunji-shi, Tokyo, Japan
Yosuke Maehara
Affiliation:
Division of Applied Physics, Faculty of Engineering, Hokkaido University, Sapporo, Japan
Ryo Kitaura
Affiliation:
Department of Chemistry & Institute for Advanced Research, Nagoya University, Nagoya, Japan
Hisanori Shinohara
Affiliation:
Department of Chemistry & Institute for Advanced Research, Nagoya University, Nagoya, Japan
Kazutoshi Gohara
Affiliation:
Division of Applied Physics, Faculty of Engineering, Hokkaido University, Sapporo, Japan

Abstract

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Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 35 - 36
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Erni, R, et al, Phys. Rev. Lett 102 (2009) p. 096101. OL Krivanek et al, Ultramicroscopy 110 (2010) p. 935., S Uno et al, Optik 116 (2005) p. 438., UA Kaiser et al, Ultramicroscopy 111 (2011) p. 1239., T Sasaki et al, Ultramicroscopy 145 (2014) p. 50.CrossRefGoogle Scholar
[2] Sayer, D, Acta Crystallogr A5 (1952) p. 843. RW Gerchberg and W.O. Saxton, Optik 35 (1972) p. 237., JR Fienup, Appl. Opt. 23 (1982) p. 2758., J Miao et al, Nature 400 (1999) p. 342., JM Zuo et al, Science 300 (2003) p. 1419.CrossRefGoogle Scholar
[3] Kamimura, O, et al, Appl. Phys. Lett 92 (2008). p. 024106.CrossRefGoogle Scholar
[4] Kamimura, O, et al, Ultramicroscopy 110 (2010). p. 130.CrossRefGoogle Scholar
[5] Kamimura, O, et al, Appl. Phys. Lett 98 (2011). p. 174103.CrossRefGoogle Scholar
[6] Part of this work was supported by the Japan Science and Technology Agency.Google Scholar