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120 kV TEM Equipped with an Ultra High Resolution Lens and its Application

Published online by Cambridge University Press:  25 July 2016

K. Tamura ,
T. Kubo ,
H. Mise ,
M. Wayama ,
K. Nakano ,
M. Shirai ,
H. Matsumoto  and
T. Yaguchi
K. Tamura
Affiliation:
Advanced Microscope System Design 2nd Dept., Hitachi High-Technologies Corporation, Ibaraki, Japan
T. Kubo
Affiliation:
Advanced Microscope System Design 2nd Dept., Hitachi High-Technologies Corporation, Ibaraki, Japan
H. Mise
Affiliation:
Advanced Microscope System Design 2nd Dept., Hitachi High-Technologies Corporation, Ibaraki, Japan
M. Wayama
Affiliation:
Application Development Dept., Hitachi High-Technologies Corporation, Ibaraki, Japan
K. Nakano
Affiliation:
Application Development Dept., Hitachi High-Technologies Corporation, Ibaraki, Japan
M. Shirai
Affiliation:
Application Development Dept., Hitachi High-Technologies Corporation, Ibaraki, Japan
H. Matsumoto
Affiliation:
Application Development Dept., Hitachi High-Technologies Corporation, Ibaraki, Japan
T. Yaguchi
Affiliation:
Advanced Microscope System Design 2nd Dept., Hitachi High-Technologies Corporation, Ibaraki, Japan

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 48 - 49
Copyright
© Microscopy Society of America 2016 

References

Reference:

[1] Kubo, T., et al. (2013). Microsc.Microanal 19(Suppl 2 1328.Google Scholar
[2] Yaguchi, T., et al. (2015). Microsc.Microanal 21(Suppl 3 1817.CrossRefGoogle Scholar
[3] Kamino, T., et al, Proc.of IMC 18, Prague, Czech Republic 2014). IT-6-P-1552.Google Scholar