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Reply to the comments of Y.H. Liu: Ion sputter erosion in metallic glass—A response to “Comment on: Homogeneity of Zr64.13Cu15.75Ni10.12Al10 bulk metallic glass” by L-Y. Chen, Y-W. Zeng, Q-P. Cao, B-J. Park, Y-M. Chen, K. Hono, U. Vainio, Z-L. Zhang, U. Kaiser, X-D. Wang,and J-Z Jiang [J. Mater. Res. 24, 3116 (2009)]

Published online by Cambridge University Press:  31 January 2011

Lian-Yi Chen ,
Qing-Ping Cao ,
J.Z. Jiang  and
Jing-Wei Deng
J.Z. Jiang*
Affiliation:
International Center for New-Structured Materials (ICNSM), Zhejiang University, Hangzhou 310027, People's Republic of China; Laboratory of New-Structured Materials, Department of Materials Science and Engineering, Zhejiang University, Hangzhou 310027, People's Republic of China; and Department of Physics, Zhejiang University, Hangzhou 310027, People's Republic of China
Jing-Wei Deng
Affiliation:
Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, Shenyang 110016, People's Republic of China
*
a)Address all correspondence to this author. e-mail: [email protected]
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Abstract

The morphology of the dark and bright regions observed by transmission electron microscopy for the Zr64.13Cu15.75Ni10.12Al10 bulk metallic glass strongly depends on the ion beam parameters used for ion milling. This indicates that the ion beam could introduce surface fluctuation to metallic glasses during ion milling.

Keywords

Ion-beam processingAmorphousTransmission electron microscopy (TEM)
Type
Comments and Reply
Information
Journal of Materials Research , Volume 25 , Issue 3 , March 2010 , pp. 602 - 604
Copyright
Copyright © Materials Research Society 2010

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References

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