Hostname: page-component-cd9895bd7-lnqnp Total loading time: 0 Render date: 2024-12-23T12:34:29.937Z Has data issue: false hasContentIssue false

Tailoring Carbon Nanoclusters to Desired Morphologies

Published online by Cambridge University Press:  31 January 2011

Jun Jiao
Affiliation:
Department of Materials Science and Engineering, University of Arizona, Tucson, Arizona 85721
Supapan Seraphin
Affiliation:
Department of Materials Science and Engineering, University of Arizona, Tucson, Arizona 85721
Get access

Abstract

The preparation and structural characterization of carbon nanoclusters of different morphologies produced by three different methods and under a variety of conditions is reported. In a comparative manner, the growth phenomena and structural properties of carbon nanoclusters are investigated as synthesized by (a) the high temperature (˜3000 °C) and high carbon-content process of the conventional arc-discharge, (b) the high temperature but low carbon-content process of the modified arc-discharge, and finally (c) the relatively low temperature (˜500 °C) process of Ni catalytic disproportionation of carbon monoxide.

Type
Articles
Copyright
Copyright © Materials Research Society 1998

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1.Krätschmer, W., Lamb, L. D., Fostiropoulos, K., and Huffman, D. R., Nature (London) 347, 354 (1990).CrossRefGoogle Scholar
2.Iijima, S., Nature (London) 354, 56 (1991).CrossRefGoogle Scholar
3.Ebbesen, T. W. and Ajayan, P. M., Nature (London) 358, 220 (1992).CrossRefGoogle Scholar
4.Schützenberger, P. and Schützenberger, L., C. R. Acad. Sci. 111, 774 (1890).Google Scholar
5.Rodriguez, N. M., J. Mater. Res. 8, 3233 (1993).CrossRefGoogle Scholar
6.Tanaka, K., Okahara, K., Okada, M., and Yamabe, T., Chem. Phys. Lett. 191, 469 (1992).CrossRefGoogle Scholar
7.Mintmire, J. W., Dunlap, B. I., and White, C. T., Phys. Rev. Lett. 68, 631 (1992).CrossRefGoogle Scholar
8.Dresselhaus, M. S., Dresselhaus, G., and Saito, R., Phys. Rev. B 45, 6234 (1992).CrossRefGoogle Scholar
9.Hamada, N., Sawada, S. I., and Oshiyama, A., Phys. Rev. Lett. 68, 1579 (1992).CrossRefGoogle Scholar
10.Curl, R. F. and Smalley, R. E., Sci. Am. 265, 54 (1991).CrossRefGoogle Scholar
11.Dresselhaus, M. S., Mater. Sci. Eng. B19, 192 (1993).CrossRefGoogle Scholar
12.Ajayan, P. M. and Iijima, S., Nature (London) 361, 333 (1993).CrossRefGoogle Scholar
13.Seraphin, S., Zhou, D., Jiao, J., Withers, J. C. and Loutfy, R., Nature (London) 362, 503 (1993).Google Scholar
14.Seraphin, S., J. Electrochem. Soc. 142, 290 (1994).CrossRefGoogle Scholar
15.Wang, X. K., Lin, X. W., Dravid, V. P., Ketterson, J. B., and Chang, R. P. H., Appl. Phys. Lett. 66, 2430 (1995).CrossRefGoogle Scholar
16.Dravid, V. P., Host, J. J., Teng, M. H., Elliott, B., Hwang, J., Johnson, D. L., Mason, T. O., and Weertman, J. R., Nature (London) 374, 602 (1995).CrossRefGoogle Scholar
17.Seraphin, S., Zhou, D., Jiao, J., Withers, J. C., and Loutfy, R., Carbon 31, 685 (1993).CrossRefGoogle Scholar
18.Saito, Y., Yoshikawa, T., and Inagaki, M., Chem. Phys. Lett. 204, 277 (1993).CrossRefGoogle Scholar
19.Majetich, S. A., Scott, J. H. J., Mchenry, M. E., and Turgut, Z., in Fullerenes: Physics, Chemistry, and New Directions VIII, edited by Ruoff, R. S. and Kadish, K. M. (The Electrochemical Society, PV 96–10, NJ, 1996), p. 673.Google Scholar
20.Nolan, P. E., Schabel, M. J., Lynch, D. C., and Cutler, A. H., Carbon 33, 79 (1995).CrossRefGoogle Scholar
21.Jiao, J., Nolan, P. E., Seraphin, S., Cutler, A. H., and Lynch, D. C., J. Electrochem. Soc. 143, 932 (1996).Google Scholar
22.Lamb, L. D. and Huffman, D. R., J. Phys. Chem. Solids 54, 1635 (1993).Google Scholar
23.Audier, M., Oberlin, A., and Oberlin, M., Carbon 19, 217 (1981).CrossRefGoogle Scholar
24.Barber, R. T. K., Barber, M. A., Harris, P. S., Feates, F. S., and Waite, R. J., J. Catal. 26, 51 (1972).Google Scholar
25.Baker, R. T. K. and Rodriguez, N. M., Mat. Res. Soc. Symp. Proc. 349, 251 (1994).Google Scholar
26.Jiao, J., Seraphin, S., Wang, X. K., and Withers, J. C., J. Appl. Phys. Lett. 80, 103 (1996).Google Scholar
27.Mchenry, M. E., Majetich, S. A., Artman, J. O., DeGraef, M., and Staley, S. W., Phys. Rev. B 49, 11 358 (1994).CrossRefGoogle Scholar
28.Saito, Y., Okuda, M., Yoshikawa, T., Bandow, S., Yamamuro, S., Wakoh, K., Sumiyama, K., and Suzuki, K., J. Appl. Phys. 33, L186 (1994).CrossRefGoogle Scholar
29.Ruoff, R. S., Lorents, D. C., Chan, B., Malhotra, R., and Subramoney, S., Science 259, 346 (1993).CrossRefGoogle Scholar