Hostname: page-component-78c5997874-m6dg7 Total loading time: 0 Render date: 2024-11-05T13:04:22.221Z Has data issue: false hasContentIssue false

Optical and mechanical properties of dc sputtered carbon films

Published online by Cambridge University Press:  31 January 2011

M. Rubin
Affiliation:
Lawrence Berkeley Laboratory, University of California, Berkeley, California 94720
C. B. Hopper
Affiliation:
Lawrence Berkeley Laboratory, University of California, Berkeley, California 94720
N-H. Cho
Affiliation:
Lawrence Berkeley Laboratory, University of California, Berkeley, California 94720
B. Bhushan
Affiliation:
IBM Research Division, IBM Almaden Research Center, 650 Harry Road, San Jose, California 95120-6099
Get access

Abstract

Amorphous carbon films were deposited on glass by dc magnetron sputtering from a graphite target in mixtures of argon and hydrogen. Hydrogen flow and other parameters affected the optical and mechanical properties of these films. Increasing hydrogen content caused the average visible transmittance to vary from 16% to 86% for 500-Å thick films. Maximum compressive stress and hardness occur between 0 and 1% hydrogen flow, resulting in rapid delamination. Low sputtering power moderately increases transmittance and hardness while relieving stress. Transparency is induced in both the high-hydrogen and low-power films by formation of sp3 C–C bonds. In the case of the hydrogenated films, however, a softer polymeric structure is formed.

Type
Diamond and Diamond-Like Materials
Copyright
Copyright © Materials Research Society 1990

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1Moravec, T. J. and Lee, J.C., J. Vac. Sci. Technol. 20, 338 (1982).Google Scholar
2Bubenzer, A., Dischler, B., Brandt, G., and Koidl, P., J. Appl. Phys. 54, 4590 (1983).CrossRefGoogle Scholar
3Mirtich, M. J., Nir, D., Swec, D., and Banks, B., J. Vac. Sci. Technol. A 4, 2680 (1986).CrossRefGoogle Scholar
4Zelez, J., RCA Rev. 43, 664 (1982).Google Scholar
5Tsai, H. and Bogy, D. B., J. Vac. Sci. Technol. A 5, 3287 (1987).Google Scholar
6Dischler, B., Bubenzer, A., and Koidl, P., Solid State Commun. 48, 105 (1983).CrossRefGoogle Scholar
7Couderc, P. and Catherine, Y., Thin Solid Films 146, 93 (1987).CrossRefGoogle Scholar
8Zou, J.W., Reichelt, K., Schmidt, K., and Dischler, B., J. Appl. Phys. 65, 3914 (1989).CrossRefGoogle Scholar
9Gonzalez-Hernandez, J., Chao, B. S., and Pawlik, D. A., J. Vac. Sci. Technol. A 7, 2332 (1989).CrossRefGoogle Scholar
10Goranchev, B., Schmidt, K., and Reichelt, K., Thin Solid Films 149, 177 (1987).CrossRefGoogle Scholar
11Staryga, E., Lipinski, A., Mitura, S., and Has, Z., Thin Solid Films 145, 17 (1986).CrossRefGoogle Scholar
12McKenzie, D. R., McPhedran, R. C., Botten, L. C., Savvides, N., and Netterfield, R. P., Appl. Opt. 21, 3615 (1982).CrossRefGoogle Scholar
13Savvides, N., Thin Solid Films 163, 13 (1988).CrossRefGoogle Scholar
14Kerwin, D. B., Spain, I. L., Robinson, R. S., Daudin, B., Dubus, M., and Fomentile, J., Thin Solid Films 148, 311 (1987).CrossRefGoogle Scholar
15Mirtich, M. J., Swec, D. M., and Angus, J. C., Thin Solid Films 131, 245 (1985).Google Scholar
16Grill, A., Meyerson, B.S., Patel, V.V., Reimer, J.A., and Petrich, M.A., J. Appl. Phys. 61, 2874 (1987).CrossRefGoogle Scholar
17Woollam, J. A., Natarajan, V., Lamb, J., Khan, A. A., Bu-Abbud, G., Mathine, D., Rubin, D., Dillon, R. O., Banks, B., Pouch, J., Gulino, D. A., Domitz, S., Liu, D. C., and Ingram, D., Thin Solid Films 119, 121 (1984).CrossRefGoogle Scholar
18El-Hossary, F. M., Fabian, D. J., and Sofield, C. J., Thin Solid Films 157, 29 (1988).Google Scholar
19Savvides, N., J. Appl. Phys. 59, 4133 (1986).CrossRefGoogle Scholar
20Smith, F.W., J. Appl. Phys. 55, 764 (1984).CrossRefGoogle Scholar
21Enke, K., Thin Solid Films 80, 227 (1981).Google Scholar
22Weissmantel, C., Bewilogua, K., Breuer, K., Dietrich, D., Ebersbach, U., Erler, H-J., Rau, B., and Reisse, G., Thin Solid Films 96, 31 (1982).Google Scholar
23Scharff, W., Hammer, K., Stenzel, O., Ullman, J., Vogel, M., Frauenheim, T., Eibisch, B., Roth, S., Schulze, S., and Muhling, I., Thin Solid Films 171, 157 (1989).Google Scholar
24Ishikawa, J., Takeiri, Y., Ogawa, K., and Takagi, T., J. Appl. Phys. 71, 2509 (1987).CrossRefGoogle Scholar