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Morphological and structural properties of high quality YBCO thin films

Published online by Cambridge University Press:  03 March 2011

A. Cassinese ,
A. Di Chiara ,
F. Miletto Granozio ,
S. Saiello ,
U. Scotti di Uccio  and
M. Valentino
A. Cassinese
Affiliation:
Dip. Scienze Fisiche dell'Universitá Federico II di Napoli, Italy
A. Di Chiara
Affiliation:
Dip. Scienze Fisiche dell'Universitá Federico II di Napoli, Italy
F. Miletto Granozio
Affiliation:
Dip. Scienze Fisiche dell'Universitá Federico II di Napoli, Italy
S. Saiello
Affiliation:
Dip. di Ingegneria dei Materiali e della Produzione, Universitá Federico II di Napoli, Italy
U. Scotti di Uccio
Affiliation:
Dip. Scienze Fisiche dell'Universitá Federico II di Napoli, Italy
M. Valentino
Affiliation:
Dip. Scienze Fisiche dell'Universitá Federico II di Napoli, Italy
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Abstract

High-quality YBCO thin films have been grown by Inverted Cylindrical Magnetron Sputtering (ICMS) on LaAlO3(100), SrTiO3(100), SrTiO3(110), and MgO(100) substrates. Transition temperatures of c-axis films exceed 90 K, and transition widths are within 1 K. Critical currents range up to 5 × 106 A/cm2 at 77 K. Structural and morphological features analyzed by x-ray diffraction and scanning electron microscopy, respectively, are found to be strongly dependent on film orientation and deposition temperature. In order to understand such dependence, a simple interpretation is proposed in terms of Gibbs energies and growth dynamics of the nucleation process.

Type
Articles
Information
Journal of Materials Research , Volume 10 , Issue 1 , January 1995 , pp. 11 - 17
Copyright
Copyright © Materials Research Society 1995

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