Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by
Crossref.
Nowak, R.
and
Sakai, M.
1994.
The anisotropy of surface deformation of sapphire: Continuous indentation of triangular indenter.
Acta Metallurgica et Materialia,
Vol. 42,
Issue. 8,
p.
2879.
Sakai, Mototsugu
Hanyu, Hiroyuki
and
Inagaki, Michio
1995.
Indentation‐Induced Contact Deformation and Damage of Glasslike Carbon.
Journal of the American Ceramic Society,
Vol. 78,
Issue. 4,
p.
1006.
Nowak, R.
and
Maruno, S.
1995.
Surface deformation and electrical properties of HfN thin films deposited by reactive sputtering.
Materials Science and Engineering: A,
Vol. 202,
Issue. 1-2,
p.
226.
Nowak, R.
1995.
Plastic Deformation of Ceramics.
p.
149.
Nowak, R.
and
Maruno, S.
1995.
Plastic Deformation of Ceramics.
p.
207.
NOWAK, R.
LI, C.L.
SOGA, T.
UMENO, M.
and
MARUNO, S.
1996.
Advances in Engineering Plasticity and its Applications (aepa 1996).
p.
881.
Rother, B.
1996.
Depth-sensing indentation measurements as mechanical probes for tribological coatings.
Surface and Coatings Technology,
Vol. 86-87,
Issue. ,
p.
535.
Nowak, R.
Sekino, T.
and
Niihara, K.
1996.
Surface deformation of sapphire crystal.
Philosophical Magazine A,
Vol. 74,
Issue. 1,
p.
171.
Nowak, R.
Li, C. L.
and
Maruno, S.
1997.
Low-load indentation behavior of HfN thin films deposited by reactive rf sputtering.
Journal of Materials Research,
Vol. 12,
Issue. 1,
p.
64.
Nowak, R.
Miyagawa, Y.
Li, C.L.
Nakao, S.
Maruno, S.
and
Miyagawa, S.
1997.
Post-deposition reduction of internal stress in thin films: The case of HfN coatings bombarded with Au ions.
Materials Letters,
Vol. 33,
Issue. 1-2,
p.
31.
Berns, Hans
and
Franco, Sinésio D.
1997.
Caracterização in Situ de Propriedades Mecânicas de Materiais Resistentes ao Desgaste Abrasivo Usando o Método da Indentação.
Cerâmica,
Vol. 43,
Issue. 281-282,
p.
128.
Nowak, R.
Soga, T.
and
Umeno, M.
1997.
Surface deformation of the InGaN thin films deposited on a sapphire substrate.
Thin Solid Films,
Vol. 295,
Issue. 1-2,
p.
193.
Niezgoda, Tadeusz
Małachowski, Jerzy
and
Boniecki, Marek
1998.
Finite element simulation of vickers microindentation on alumina ceramics.
Ceramics International,
Vol. 24,
Issue. 5,
p.
359.
Nowak, R.
Li, C.L.
and
Swain, M.V.
1998.
Comparison of implantation with Ni2+ and Au2+ ions on the indentation response of sapphire.
Materials Science and Engineering: A,
Vol. 253,
Issue. 1-2,
p.
167.
Manory, R.R.
Li, C.L.
Fountzoulas, C.
Demaree, J.D.
Hirvonen, J.K.
and
Nowak, R.
1998.
Effect of nitrogen ion-implantation on the tribological properties and hardness of TiN films.
Materials Science and Engineering: A,
Vol. 253,
Issue. 1-2,
p.
319.
Nowak, R.
Yoshida, F.
Morgiel, J.
and
Major, B.
1999.
Postdeposition relaxation of internal stress in sputter-grown thin films caused by ion bombardment.
Journal of Applied Physics,
Vol. 85,
Issue. 2,
p.
841.
Nowak, R
Sekino, T
and
Niihara, K
1999.
Non-linear surface deformation of the (101̄0) plane of sapphire: identification of the linear features around spherical impressions.
Acta Materialia,
Vol. 47,
Issue. 17,
p.
4329.
Rother, B
Herrmann, U
and
Schulze, S
2001.
Wear resistant carbon coatings deposited without substrate bias voltage.
Thin Solid Films,
Vol. 398-399,
Issue. ,
p.
187.
Stevenson, Michael E
Kaji, Masaki
and
Bradt, Richard C
2002.
Microhardness anisotropy and the indentation size effect on the basal plane of single crystal hematite.
Journal of the European Ceramic Society,
Vol. 22,
Issue. 7,
p.
1137.
Kaji, Masaki
Stevenson, Michael E.
and
Bradt, Richard C.
2002.
Knoop Microhardness Anisotropy and the Indentation Size Effect on the Basal Plane of Single‐Crystal Alumina (Sapphire).
Journal of the American Ceramic Society,
Vol. 85,
Issue. 2,
p.
415.