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Effects of residual (or internal) stress on ferroelectric domain wall motion in tetragonal lead titanate

Published online by Cambridge University Press:  31 January 2011

Wonyoung Chang ,
Alexander H. King  and
Keith J. Bowman
Wonyoung Chang
Affiliation:
Battery Research Center, Korea Institute of Science and Technology, Seongbuk-gu, Seoul 136-791, Korea
Alexander H. King
Affiliation:
Ames Laboratory, Ames, Iowa 50011
Keith J. Bowman*
Affiliation:
Purdue University, West Lafayette, Indiana 47907
*
a) Address all correspondence to this author. e-mail: [email protected]
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Abstract

The effect of temperature on grinding-induced texture in tetragonal lead titanate (PT) has been investigated as a function of the magnitude of loading applied to the sample surface during grinding, using in situ x-ray diffraction (XRD) with an area detector. Compared to the ground PT under lower loading conditions (5 N), the ground PT under higher loading conditions (40 N) retains strong ferroelastic texture near the Curie temperature (TC) around 350 °C and undergoes smaller changes in lattice parameter or tetragonality versus temperature during in situ thermal cycling between room temperature and approximately 100 °C above the TC. Inhibited depoling of ground PT materials investigated by in situ texture measurements demonstrates the effects of residual stresses.

Keywords

FerroelectricPiezoelectricX-ray diffraction (XRD)
Type
Articles
Information
Journal of Materials Research , Volume 24 , Issue 5 , May 2009 , pp. 1803 - 1809
Copyright
Copyright © Materials Research Society 2009

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References

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