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Defect structure evolution and abnormal grain growth during spark plasma sintering of nano WC–Si powders

Published online by Cambridge University Press:  12 April 2016

A.K. Nanda Kumar ,
B. Subramanian  and
Kazuya Kurokawa
A.K. Nanda Kumar*
Affiliation:
Functional Materials Division, CSIR-CECRI, Karaikudi 630 003, India
B. Subramanian
Affiliation:
Functional Materials Division, CSIR-CECRI, Karaikudi 630 003, India
Kazuya Kurokawa
Affiliation:
National Institute of Technology, Tomakomai College, Nishikioka, Tomakomai 059 1275, Japan
*
a)Address all correspondence to this author. e-mail: [email protected]
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Abstract

The microstructural evolution during spark plasma sintering of ultrafine WC–1 wt% Si (n-WC–Si) is presented. At 1323 K (T < TmSi), extensive stacking faults on the $\left\{ {10\bar 10} \right\}$ prismatic planes are observed. The defect microstructure can be described as a combined shear of $1/6\left\langle {\bar 12\bar 13} \right\rangle$ on the prism planes and simultaneous out-diffusion of carbon through the faults to the interparticle boundaries. At temperatures near TmSi (1673 K), a large fraction of abnormally grown platelets is observed. These platelets contain a single planar defect on their basal planes, described by a ${1 \mathord{\left/ {\vphantom {1 3}} \right. \kern-\nulldelimiterspace} 3}\left\langle {10\bar 10} \right\rangle$ translation of the carbon atoms across a Σ1 grain boundary (GB). Three factors contribute to the abnormally high density of platelets: (i) the low-temperature prismatic dislocations interact to form facet-roughening steps/kinks that act as nucleation sites, (ii) a liquid phase triggers an increased growth rate in the vicinity of the Si inclusions, and (c) the basal twin produces a re-entrant edge for 2D nucleation.

Keywords

spark plasma sinteringnano tungsten carbideabnormal grain growthstacking faults
Type
Articles
Information
Journal of Materials Research , Volume 31 , Issue 10 , 28 May 2016 , pp. 1466 - 1476
Copyright
Copyright © Materials Research Society 2016 

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