Hostname: page-component-78c5997874-fbnjt Total loading time: 0 Render date: 2024-11-19T22:52:07.207Z Has data issue: false hasContentIssue false
  • English
  • Français

Comparison of diffraction methods for measurement of surface damage in superalloys

Published online by Cambridge University Press:  01 July 2006

L.N. Brewer ,
M.A. Othon ,
Y. Gao ,
B.T. Hazel ,
W.H. Buttrill  and
Zhong Zhong
L.N. Brewer*
Affiliation:
GE Global Research Center, Niskayuna, New York 12309
M.A. Othon
Affiliation:
GE Global Research Center, Niskayuna, New York 12309
Y. Gao
Affiliation:
GE Global Research Center, Niskayuna, New York 12309
B.T. Hazel
Affiliation:
GE Aircraft Engines, Cincinnati, Ohio 45215
W.H. Buttrill
Affiliation:
GE Aircraft Engines, Cincinnati, Ohio 45215
Zhong Zhong
Affiliation:
National Synchrotron Light Source, Brookhaven National Laboratory, Upton, New York 11970
*
a) Address all correspondence to this author. e-mail: [email protected] Present address: Sandia National Laboratories, Albuquerque, NM 87185-1411.
Get access

Abstract

Surface damage from machining operations is a potential source of failure in metallic components. The ability to quantitatively characterize the depth and extent of the damage layer is critical to controlling the machining process. Electron back scattered diffraction and synchrotron high energy x-ray diffraction were applied to the measurement of machining surface damage in a Ni-based super alloy. Both techniques clearly showed a plastic deformation profile below the surface as a function of the machining conditions used. Using the average intragrain misorientation parameter, the electron back scattered diffraction was able to quantify the amount of surface damage from one surface treatment to another. In addition, the x-ray diffraction measurements were able to simultaneously measure the elastic strain as a function of depth from the surface.

Keywords

MachiningScanning electron microscopy (SEM)X-ray diffraction (XRD)
Type
Articles
Information
Journal of Materials Research , Volume 21 , Issue 7 , July 2006 , pp. 1775 - 1781
Copyright
Copyright © Materials Research Society 2006

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1.Noyan, I.C., Cohen, J.B.: Residual Stress: Measurement by Diffraction and Interpretation (Springer-Verlag, New York, 1987), p. 276.CrossRefGoogle Scholar
2.Fitzpatrick, M.E., Lodini, A.: Analysis of Residual Stress by Diffraction Using Neutron and Synchrotron Radition (Taylor & Francis, London, UK, 2003), p. 354.CrossRefGoogle Scholar
3.Field, D.P., Wright, S.I., Trivedi, P.: Microtextural analysis of grain fragmentation in aluminum. Mater. Sci. Forum 426–432, 3739 (2003).CrossRefGoogle Scholar
4.Hu, Y.M., Floer, W., Krupp, U., Christ, H.J.: Microstructurally short fatigue crack initiation and growth in Ti–6.8Mo–4.5Fe– 1.5Al. Mater. Sci. Eng. A278, 170 (2000).CrossRefGoogle Scholar
5.King, W.E., Stolken, J.S., Kumar, M., Schwartz, A.J. Strategies for analyzing EBSD datasets, in Electron Backscatter Diffraction in Materials Science, edited by Schwartz, A.J., Kumar, M., and Adams, B.L. (Kluwer Academic, New York, 2000), pp. 153–169.CrossRefGoogle Scholar
6.Li, B.L., Godfrey, A., Liu, Q.: Investigation of macroscopic grain sub-division of an IF-Steel during cold rolling. Mater. Sci. Forum 408–412, 1185 (2002).CrossRefGoogle Scholar
7.Mino, K., Fukuoka, C., Yoshizawa, H.: Evolution of intragranular misorientation during plastic deformation. J. Jpn. Inst. Metals 64(1), 50 (2000).CrossRefGoogle Scholar
8.Randle, V., Hansen, N., Jensen, D. Juul: The deformation behaviour of grain boundary regions in polycrystalline aluminum. Philos. Mag. A 73(2), 265 (1996).CrossRefGoogle Scholar
9.Tucker, A.T., Wilkinson, A.J., Henderson, M.B., Ubhi, H.S., Martin, J.W.: Measurement of fatigue crack plastic zones in fine grain materials using electron backscattered diffraction. Mater. Sci. Technol. 16, 427 (2000).CrossRefGoogle Scholar
10.Wilkinson, A.J., Gonzalez, G., Dingley, D.J.: The measurement of local plastic deformation in a metal-matrix composite by electron back-scatter patterns. J. Microsc. 169(2), 255 (1993).CrossRefGoogle Scholar
11.Wilkinson, A.J., Henderson, M.B., Martin, J.W.: Examination of fatigue crack plastic zones using scanning-electron-microscope-based electron diffraction techniques. Philos. Mag. Lett. 74(3), 145 (1996).CrossRefGoogle Scholar
12.Ahmed, J., Wilkinson, A.J., Roberts, S.G.: Study of dislocation structures near fatigue cracks using electron channelling contrast imaging technique (ECCI). J. Microsc. 195(3), 197 (1999).CrossRefGoogle Scholar
13.Gerberich, W.W., Davidson, D.L., Kaczorowski, M.: Experimental and theoretical strain distributions for stationary and growing cracks. J. Mech. Phys. Solids 38(1), 87 (1990).CrossRefGoogle Scholar
14.Angeliu, T.M., And, P.L.resen, Hall, E., Sutliff, J.A., Sitzman, S., and Horn, R.M.: Intergranular stress corrosion cracking of unsensitized stainless steels in BWR environments, in Ninth International Symposium on Environmental Degradation of Materials in Nuclear Power Systems-Water Reactors, edited by Ford, R.P., Bruemmer, S.M., and Was, G.S. (TMS, Warrendale, PA, 1999), pp. 311–317.CrossRefGoogle Scholar
15.Sutliff, J.A. An investigation of plastic strain in copper by automated EBSP, in Microscopy and Microanalysis, edited by Bailey, G.W., Jerome, W.G., McKernan, S., Mansfield, J.F., and Price, R.L. (Springer Verlag, Portland, OR, 1999), pp. 236–237.Google Scholar
16.Wilkinson, A.J., Dingley, D.J.: Quantitative deformation studies using electron back scatter patterns. Acta Metall. 39, 3047 (1991).CrossRefGoogle Scholar
17.Wardle, S.T., Lin, L.S., Cetel, A.D., and Adams, B.L.: Orientation imaging microscopy: Monitoring residual stress profiles in single crystals using imaging quality parameter, IQ, in 52nd Annual Meeting of the Microscopy Society of America, edited by Bailey, G.W., and Garratt-Reed, A.J. (San Francisco Press, San Francisco, CA, 1994), pp. 680–681.Google Scholar
18.Orsund, R., Njelen, J., Nes, E.: Local lattice curvature and deformation heterogeneities in heavily deformed aluminum. Scripta Metall. 23, 1193 (1989).CrossRefGoogle Scholar
19.Wright, S.I.: A review of automated orientation imaging microscopy (OIM). J. Comput. Assist. Microsc. 5, 207 (1993).Google Scholar
20.Lehockey, E.M., Lin, Y., Lepik, O.E. Mapping residual plastic strain in materials using electron backscatter diffraction, in Electron Backscatter Diffraction in Materials Science, edited by Schwartz, A.J., Kumar, M., and Adams, B.L. (Kluwer Academic, New York, 2000), pp. 247–264.CrossRefGoogle Scholar
21.Kamaya, M., Wilkinson, A.J., Titchmarsh, J.M.: Measurement of plastic strain of polycrystalline material by electron backscatter diffraction. Nucl. Eng. Des. 235, 713 (2005).CrossRefGoogle Scholar
22.Brewer, L.N., Othon, M.A., Young, L.M., Angeliu, T.M.: Misorientation mapping for visualization of plastic deformation via electron back-scattered diffraction. Microsc. Microanal. 12, 85 (2006).CrossRefGoogle ScholarPubMed
23.Kamaya, M., Wilkinson, A.J., Titchmarsh, J.M.: Quantification of plastic strain of stainless steel and nickel alloy by electron backscatter diffraction. Acta Mater. 54, 539 (2006).CrossRefGoogle Scholar
24.Sun, S., Adams, B.L., King, W.E.: Observations of lattice curvature near the interface of a deformed aluminum bicrystal. Philos. Mag. A 80(1), 9 (2000).CrossRefGoogle Scholar
25.ElDasher, B.S., Adams, B.L., Rollett, A.D.: Viewpoint. Experimental recovery of geometrically necessary dislocation density in polycrystals. Scripta Mater. 48, 141 (2003).CrossRefGoogle Scholar
26.Field, D.P., Trivedi, P.B., Wright, S.I., Kumar, M.: Analysis of local orientation gradients in deformed single crystals. Ultramicroscopy 103, 33 (2005).CrossRefGoogle ScholarPubMed
27.Minitab version 12.0 (Minitab Inc., State College, PA, 2001).Google Scholar
28.Zhong, Z., Thomlinson, W., Chapman, D., Sayers, D.: Interpretation of bent-crystal rocking curves using phase-space diagrams. Nucl. Instrum. Meth. Phys. Res. A 447, 556 (2000).CrossRefGoogle Scholar
29.Zhong, Z., Kao, C.C., Siddons, D.P., Hastings, J.B.: Sagittal focusing of high-energy synchrotron x-rays with asymmetric laue crystals. II. Experimental studies. J. Appl. Crystallogr. 34, 646 (2001).CrossRefGoogle Scholar
30.Othon, M.A., Brewer, L.N., Gao, Y., Hazel, B.T., Buttrill, W.H. Diffraction based measurement of surface machining damage in superalloys, in Microscopy and Microanalysis, Vol. 9, edited by Lyman, C.E., Herman, B., Schatter, H., Hudson, J., and Dickens, E. (Cambridge University Press, New York, NY, 2003) pp. 726–729.Google Scholar