Hostname: page-component-78c5997874-xbtfd Total loading time: 0 Render date: 2024-11-20T02:30:24.703Z Has data issue: false hasContentIssue false
  • English
  • Français

Possible Density Determination of the Nebular Component of Cataclysmic Variables with the N III 4641/4635 Line Ratio

Published online by Cambridge University Press:  22 February 2018

Joaquín Bohigas ,
Eduardo Pérez-Tijerina  and
Roberto Machorro
Joaquín Bohigas
Affiliation:
Instituto de Astronomía, UNAM, Apdo. Postal 877, 22800 Ensenada, B.C., México ([email protected])
Eduardo Pérez-Tijerina
Affiliation:
Facultad de Ciencias Físico Matermáticas, UANL, Apdo. Postal 101-F, 66450 San Nicolás de los Garza, N.L., México ([email protected])
Roberto Machorro
Affiliation:
Centro de Ciencias de la Materia Condensada, UNAM, Apdo. Postal 2681, 22800 Ensenada, B.C., México ([email protected])

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

The dependence of the N III 4641/4635 line ratio on the electron density is presented. It is shown that this ratio may be an important diagnostic tool in cataclysmic variables.

Pérez-Tijerina, Bohigas & Machorro (2001) used the Chianti code and database developed by the U.S. Nautical Observatory (Landi, 200) in order to find density and temperature sensitive line ratios in the conditions occuring in plasmas produced in pulsed laser deposition experiments for thin film deposition, i.e., around 1018 cm 3 and 104 K. Level populations are determined considering only radiative decay and collisional excitation and de-excitation.

Type
The Contributed Papers
Information
International Astronomical Union Colloquium , Volume 194: Compact binaries in the galaxy and beyond , 2004 , pp. 258
Copyright
Copyright © Instituto de astronomia/revista mexicana de astronomίa y astrofίsica 2004

References

Landi, E. 2000, RMexAA (Conf. Series) 9, 140 Google Scholar
Pérez-Tijerina, E., Bohigas, J. & Machorro, R. 2001, J. Appl. Phys. 90, 3192 Google Scholar