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X-ray Powder Diffraction QPA by Rietveid Pattern- Fitting - Scope and Limitations
Published online by Cambridge University Press: 06 March 2019
Abstract
The X-ray Analytical Science Group at Curtin university of Technology has been developing and evaluating Rietveld pattern-fitting for materials analysis since 1985. The results are reviewed with particular reference to preferred orientation, crystallinity and phase abundance.
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- Research Article
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- Copyright © International Centre for Diffraction Data 1989
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