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A Theoretical Study of the Effects of Dead Layers on Low Energy X-Ray Detectors
Published online by Cambridge University Press: 06 March 2019
Abstract
A Monte-Carlo model has been developed to calculate the effect entrance windows, or dead layers, have on the spectral shape and the counting efficiency of semiconductor detectors used in the low energy x-ray region (1 – 5 KeV).
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- Copyright © International Centre for Diffraction Data 1977