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A Theoretical Study of the Effects of Dead Layers on Low Energy X-Ray Detectors

Published online by Cambridge University Press:  06 March 2019

R. Hight  and
C. N. Inskeep
R. Hight
Affiliation:
University of Missouri - St. Louis, St. Louis, Missouri 63121
C. N. Inskeep
Affiliation:
University of Evansville, Evansville, Indiana
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Abstract

A Monte-Carlo model has been developed to calculate the effect entrance windows, or dead layers, have on the spectral shape and the counting efficiency of semiconductor detectors used in the low energy x-ray region (1 – 5 KeV).

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 21: Twenty-Sixth Annual Conference on Applications of X-ray Analysis, August 3-5, 1977 , 1977 , pp. 207 - 215
Copyright
Copyright © International Centre for Diffraction Data 1977

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References

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