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Some Special Sample-Mounting Devices for the X-Ray Fluorescence Spectrometer*

Published online by Cambridge University Press:  06 March 2019

Eugene P. Bertin
Affiliation:
Radio Corporation of America Electron Tube Division Harrison, New Jersey
Rita J. Longobucco
Affiliation:
Radio Corporation of America Electron Tube Division Harrison, New Jersey
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Abstract

Various sample-mounting devices are described for use with a commercial flat-crystal X-ray fluorescence spectrometer having conventional (i.e., not inverted) geometry: (1) a sample drawer with two sample “spinners,” one for rotation of flat samples in their own plane, the other for rotation of cylindrical or filamentary samples about an axis normal to the plane defined by the directions of the primary and secondary X-ray beams; (2) rotatable mounting stages for filter paper disks and various very small samples; (3) a sample drawer for selected area operation with pinhole or slit apertures in the primary beam or pinhole apertures in the secondary beam; (4) a liquid cell with 0.00025-in. Mylar window (the cell is inexpensive, easily filled and rinsed, and usable 20-50 times before the window must be replaced); (5) three types of cell for powder samples (one has a 0.00025-in, Mylar window and is filled through a port in the top; the other types are open on both sides and are filled by placing them on glass plates and introducing the powder from the back; one of these back-loading cells permits rotation of the powder sample); (6) rotatable stages for briquetted powder samples; (7) mounting devices for wire samples on small spools (one of these devices permits rotation of the spool).

These devices were designed and made at the X-ray laboratory of the RCA plant at Harrison, N. J., and have been used there successfully with a wide variety of samples for several years.

Type
Research Article
Copyright
Copyright © International Centre for Diffraction Data 1961

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Footnotes

*

This work was supported in part by the Department of the Navy, Bureau of Ships.

References

* A secondary-beam aperture accessory with a traversing sample stage was described by Hoinrich and McKinley at the 1960 Pittsburgh Conference on Analytical chemistry and Applied Spectroscopy. This accessory, with provision for manual or motor-driven sample translation in two mutually perpendicular directions, is available commercially. A primary-beam aperture accessory is also available commercially.