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Plane-Polarized, Two-Crystal X-Ray Spectrometer

Published online by Cambridge University Press:  06 March 2019

Raymond J. Donahue  and
Leonid V. Azároff
Raymond J. Donahue
Affiliation:
Illinois Institute of Technology, Chicago, Illinois
Leonid V. Azároff
Affiliation:
Illinois Institute of Technology, Chicago, Illinois
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Abstract

A two-crystal spectrometer employing a Cole polarizer made from a germanium crystal as one of the crystals is described. Experimental tests show that placing the polarizer crystal in the second position markedly improves the degree of plane polarisation, in full agreement with the predictions of the dynamical theory of X-ray diffraction. Tests indicate that the twice-diffracted beam h better than 95% plane polarized. The angular resolving power of the instrument is comparable to that of conventional two-crystal spectrometers. The almost wholly planepolarized monochromatic X-radiation, moreover, permits certain tests to be carried out far more effectively than is possible with partly polarized X-ray beams.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 9: Fourteenth Annual Conference on Applications of X-ray Analysis, August 25-27, 1965 , 1965 , pp. 251 - 258
Copyright
Copyright © International Centre for Diffraction Data 1965

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References

1. de L. Kronig, R., Z. Physik. 70: 317, 1931; 75: 191, 1932.Google Scholar
2. Stephenson, S. T., Phys. Ref. 44: 349, 1933.Google Scholar
3. Krogstad, R., Nelson, W., and Stephenson, S. T., Phys. Rev. 92: 1394, 1954.Google Scholar
4. Nelson, W. F., Ph.D. Thesis, Washington State College, 1956 (unpublished).Google Scholar
5. El-Hassaini, J. M. and Stephenson, S. T., Phys. Rev. 109: 51, 1958.Google Scholar
6. Singh, J. N., Phys. Rev. 123: 1724, 1961.Google Scholar
7. Boster, T. A. and Edwards, J. E., J. Chen. Phys. 36: 3031, 1962.Google Scholar
8. Azaroff, L. V., Rev. Mod. Phys. 35: 1012, 1963.Google Scholar
9. Alexander, E., Fraenkel, B. S., J. Perel, and K. Rabinovich, Phys. Rev, 132: 1554, 1963.Google Scholar
10. Cole, H., Chambers, F. W., and Wood, C., J. App. Phys. 32: 1942, 1961.Google Scholar