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NIST SRM 2708, Zinc Sulfide Thin Film on Polycarbonate for X-Ray Fluorescence Spectrometry
Published online by Cambridge University Press: 06 March 2019
Extract
NIST SRM 2708 is a thin film of zinc sulfide approximately 0.02 μm thick that was sputter deposited on polycarbonate substrates using a NIST ion-beam instrument. It is intended for the standardization of x-ray fluorescence spectrometers, especially for analysis of air particulates or similar material collected on filter media.
- Type
- V. X-Ray Characterization of Thin Films
- Information
- Copyright
- Copyright © International Centre for Diffraction Data 1992