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Application of X-Ray Fluorescence Analysis to Process Control

Published online by Cambridge University Press:  06 March 2019

F. Bernstein
F. Bernstein*
Affiliation:
General Electric Company Milwaukee, Wisconsin
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Abstract

The application of X-ray fluorescence-analysis methods to process control is discussed. Various methods of sample preparation are reviewed and compared. The use of the direct sampling technique is discussed and consideration is given to the effects of particle size on precision and accuracy of analytical results. The mechanism of these effects if presented, and some general principles concerning the relationship of fluorescent intensities and particle sizes of pure materials and mixtures are derived. Examples of particle-size effects in cement and mining applications are illustrated.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 5: Tenth Annual Conference on Applications of X-ray Analysis, August 7-9, 1961 , 1961 , pp. 486 - 499
Copyright
Copyright © International Centre for Diffraction Data 1961

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References

1. Adler, I. and Axelrod, J. M., Anal. Chem., Vol. 29, No. 9, September, 1957, p. 1280.Google Scholar
2. Claisse, F., Norelco Reporter, Vol. 4, No. 1, January, 1957, p. 3.Google Scholar
3. Wood, R. E. and Bingham, E. R., Pittsburgh Conference on Analytical Chemistry and Applied Spectroscopy, February, 1961.Google Scholar
4. Kester, B. E., AIEE Cement Industry Conference, May, 1960.Google Scholar
5. Andermann, G. and Allen, J. D., Advances in X-Ray Analysis, Vol. 4, University of Denver, Plenum Press, New York, 1960, p. 414.Google Scholar
6. Meyer, J. W., Anal. Chem., Vol. 37, No. 6, May, 1961, p. 692.Google Scholar
7. Chodos, A. A. and Engel, C. G., Advances in X-ray Analysis, Vol. 4, University of Denver, Plenum Press, New York, 1960, p. 401.Google Scholar
8. Pitchford, A. H., Norelco Reporter, Vol. 7, No. 4, July, 1960, p. 117.Google Scholar
9. Gunn, E. L., Advances in X-Ray Analysis, Vol. 4, University of Denver, Plenum Press, New York, 1960, p. 382.Google Scholar