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The Use of an X-Ray Fluorescence Semi-Microprobe Attachment in Metallurgy
Published online by Cambridge University Press: 06 March 2019
Abstract
Standard X-ray fluorescence spectrogmphs are capable of measuring elements in areas as small as ⅛-in. diameter, while an electron mitroprobe specialises in areas less than 10 μ. Frequently, a sample of an intermediate size (0.1 mm to 2 mm) requires analysis, so an attachment was designed for Philips Electronics Company equipment. Reasons for its design, sensitivity of the system, and several metallurgical examples showing its versatility are discussed in the report.
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- Copyright © International Centre for Diffraction Data 1964
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