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Synchrotron X-Ray Scattering for the Structural Characterization of Catalysts

Published online by Cambridge University Press:  06 March 2019

R. J. De Angelis
Affiliation:
Department of Metallurgical Engineering and Materials Science, Lexington, KY 40506
A. G. Dhere
Affiliation:
Department of Metallurgical Engineering and Materials Science, Lexington, KY 40506
M. A. Maginnis
Affiliation:
Department of Metallurgical Engineering and Materials Science, Lexington, KY 40506
P. J. Reucroft
Affiliation:
Department of Metallurgical Engineering and Materials Science, Lexington, KY 40506
G. E. Ice
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, TN 37831
A. Habenschuss
Affiliation:
Oak Ridge Associated Universities, Oak Ridge, TN 373831
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Extract

Discussions exist in the literature concerning the application of single x-ray diffraction profile analysis to determine the average particle size, particle size distribution and root mean squared strain in catalytic systems. Nandi et al. have shown that the single order analysis can give erroneous strain results and is subject to error in the large particle size range. They further indicated that the initial slope of Stokes corrected Fourier coefficients gives more reliable average p article size than that which is calculated from single order peak shape analysis. There is apparent agreement that the average particle size and the particle size distribution measured by single order profile analysis, in small metal particle systems, are reliable.

Type
VII. Synchrotron and Neutron Diffraction
Copyright
Copyright © International Centre for Diffraction Data 1986

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References

1. Nandi, R.K., Kuo, H.K., Sehlosberg, W., Wissler, G., Cohen, J.B. and Crist, B. Jr., J. Appl. Cryst., 17: 22 (1984).Google Scholar
2. De Angel, R.J., Dhere, A.G., Lewis, J.D. and Kuo, H.K., Application of X-Ray Diffraction Techniques to Study the Sintering of Catalysts, in “Sintering and Herogeneous Catalysts ”,. Kuczynski, C., Miller, A.E. and Sargent, G.A., Eds., Plenum Publishing Corporation, 1984.Google Scholar
3. Mignot, J. and Rondot, D., Acta Met., 23, 1321 (1975).Google Scholar
4. Lewis, J.D., Thesis, M.S., University of Kentucky, 1984.Google Scholar
5. Mazdiyasni, K.S., Lynch, C.T. and Smith, J.S. II. J. Arc. Cer. Soc., 50: 532 (1967).Google Scholar
6. Gnur, N.F. and White-DePace, S. M., “User Manual: Guide to the VUV. nd X-Ray Beam Lines”, Brookhaven National Laboratory, Upton, NY. May 1986, p. 126.Google Scholar
7. Barral, M., Sprauel, J.M., Lebrun, J.L., Maeder, G. and Megtert, S., Adv. in X. Ray Anal., 27 : 149 (1984).Google Scholar
8. Warren, B.E., “X-Ray Diffraction”, Addison Wesley Publishing Company, New York, 1969.Google Scholar
9. Warren, B.E. and Aver bach, B.L., J. Appl. Phys., 21 : 595 (1950);. 23 = 497 (1952).Google Scholar
10. Ganesan, P., Kuo, H.K., Saavedra, A., and De Angelis, R.J.,J. Catal., 52: 310 (1978).Google Scholar
11. Warren, B.E. and Warekois, E.P., Acta Met., 3: 473 (1955).Google Scholar
12. Wagner, C.N.J., Arch. Eisenhuttenw., 29: 489 (1958).Google Scholar
13. Sashital, S.R., Cohen, J.B., Burwell, R.L. Jr., and Butt, J.B., Catal., 50 : 479 (1977).Google Scholar