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Practical and "Unusual" Applications in X-ray Diffraction Using Position Sensitive Detectors

Published online by Cambridge University Press:  06 March 2019

Ralph G. Tissot  and
Michael O. Eatough
Ralph G. Tissot
Affiliation:
Sandia National Laboratories Chemical Instrumentation Research Division Albuquerque, NM 87185
Michael O. Eatough
Affiliation:
Sandia National Laboratories Chemical Instrumentation Research Division Albuquerque, NM 87185
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Abstract

Position sensitive proportional counters (PSPCs) increase the scope of X-ray diffraction analyses. High pressure flow through type PSPCs can significantly reduce data collecting times due to She ability for simultaneous data collection over large two-theta ranges. This inherent characteristic allows the diffraction user broad capabilities such as scanning very rapidly over large two- theta ranges or collecting data in real time over shorter two-theta ranges without scanning. Thus, we have been able to perform detailed high- temperature experiments in relatively short time frames, observe phase transitions and reactions as they occur, and perform unusual experiments such as observing the crystallization of a plasma spray in-situ.

Type
VII. Solid State and Position-Sensitive Detectors for XRD
Information
Advances in X-Ray Analysis , Volume 34: Thirty-Ninth Annual Conference on Applications of X-ray Analysis, July 30 - August 3, 1990 , 1990 , pp. 349 - 355
Copyright
Copyright © International Centre for Diffraction Data 1990

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References

1. Cullity, B. D., “Elements of X-Ray Diffraction”, Addison-Wesley Publishing Co., Inc, Reading, Mass (1978).Google Scholar
2. Goebel, H. E., A New Method For Fast XRPD Using A Position Sensitive Detector, in: “Advances in X-Ray Analysis”, v22, G. J. McCarthy, ed., Plenum Press, New York (1978).Google Scholar
3. Braun, M. Position Sensitive Detector Systems, Innovative Technology Inc, South Hamilton, MA.Google Scholar
4. ProfThomson, W., Personnal communication, Dept. Chemical Engineering, Washington State University, Pullman WA, (1988).Google Scholar
5. Klug, H. P. and Alexander, L. E., “X-Ray Diffraction Procedures”, John Wiley and Sons, New York (1974).Google Scholar
6. Dosch, R. G., Hydrous Metal Support Catalysts: Part 2, SAND Report 89-2400, Sandia National Laboratories, Albuquerque, NM (1990).Google Scholar
7. Tissot, R. et al., KNbO3 Characterization Using X-Ray Diffraction, American Chemical Society Mtg., (1989).Google Scholar
8. Tuttle, B. et al., Ferro-electric Potassium Niobate Thin Films, SAND Report 89-0951, Sandia National Laboratories, Albuquerque, NM (1989).Google Scholar