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Low Energy Mass Absorption Coefficients from Proton Induced X-ray Spectroscopy

Published online by Cambridge University Press:  06 March 2019

A. Lurio ,
W. Reuter  and
J. Keller
A. Lurio
Affiliation:
IBM Thomas J. Watson Research Center Yorktown Heights, New York 10598
W. Reuter
Affiliation:
IBM Thomas J. Watson Research Center Yorktown Heights, New York 10598
J. Keller
Affiliation:
IBM Thomas J. Watson Research Center Yorktown Heights, New York 10598
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Abstract

We describe a new and reliable experimental technique for the measurement of mass absorption coefficients in the 0.1 to 1 keV energy range. In this technique, the absorbing film is supported directly on a substrate which under proton bombardment will generate the x-rays whose absorption will be measured. Results are given for thirteen different metals at the C Kα (277 eV) line.

Type
X-Ray Fluorescence
Information
Advances in X-Ray Analysis , Volume 20: Twenty-Fifth Annual Conference on Applications of X-ray Analysis, August 4-6, 1976 , 1976 , pp. 481 - 486
Copyright
Copyright © International Centre for Diffraction Data 1976

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References

1. Henke, B. L. and Ebisu, E. S., University of Hawaii, AFOSR Report 72-2174; Henke, B. L. and Schattenburg, M. L., Adv. X-ray Anal. 19, 749 (1976).Google Scholar
2. Veigele, W. J., Atomic Data Tables 5, 51 (1973).Google Scholar
3. Reuter, W., Lurio, A. and Ziegler, J. F., J. Appl. Phys. 46, 3194 (1975).Google Scholar
4. Obtained from Beckwith Carbon Corporation, 16140 Raymer Street, Van Nuys, California 91406.Google Scholar
5. See “Ion Beam Surface Layer Analysis”, ed. by Mayer, J. W. and Ziegler, J. F., Elsevier Co., Lausanne, Switzerland (1974).Google Scholar
6. Khan, J. M., Potter, D. L. and Worley, R. D., Phys. Rev. 139 A1735 (1965); Toburen, L. H., Phys. Rev. A5, 2482 (1972).Google Scholar
7. Kolthoff, I. M. and Sandell, E. B. “Quantitative Inorganic Analysis,” 3rd Ed., McMillan Company, New York, 632 (1952).Google Scholar
8. Lurio, A. and Reuter, W., Appl. Phys. Letters 27, 704 (1975).Google Scholar