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The Importance of Consistent 1/d Scans in Determining Size and Strain by Powder Diffraction Profile Analysis

Published online by Cambridge University Press:  06 March 2019

Y. Zhang ,
J. H. Stewart ,
C. R. Hubbard  and
B. Morosin
Y. Zhang
Affiliation:
Previous address: Department of Chemistry, University of Maryland, College Park, MD. Current address: Ceramics Division, National Institute of Standards and Technology, Gaithersburg, MD
J. H. Stewart
Affiliation:
Department of Chemistry, University of Maryland, College Park, MD;
C. R. Hubbard
Affiliation:
Oak Ridge National Laboratory, Bldg, 4515, MS 6064, P.O. Box 2008, Oak Ridge, TN
B. Morosin
Affiliation:
Sandia National Laboratory, Albuquerque, NM
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Abstract

This paper reports and discusses the results of a computer modeling study on powder diffraction profile analysis for crystallite size and strain of polycrystalline materials. The results of this computer modeling show that if the spans of diffraction profiles in reciprocal space (1/d) are not carefully chosen, an overestimation on size and an underestimation on strain may result in analysis by both the Warren-Averbach and the Hall-Williamson methods. A general way to eliminate such errors based on profile fitting and regeneration is presented and discussed in this paper.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 33: Thirty-Eighth Annual Conference on Applications of X-ray Analysis, July 31 - August 4, 1989 , 1989 , pp. 373 - 381
Copyright
Copyright © International Centre for Diffraction Data 1989

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References

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