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Crystal Imperfections and Magnetic Domain Walls in Thick Czochralski-Grown Nickel Single Crystals

Published online by Cambridge University Press:  06 March 2019

Masao Kuriyama ,
William J. Boettinger  and
Harold E. Burdette
Masao Kuriyama
Affiliation:
Institute for Materials Research National Bureau of Standards Washington, D.C. 20234
William J. Boettinger
Affiliation:
Institute for Materials Research National Bureau of Standards Washington, D.C. 20234
Harold E. Burdette
Affiliation:
Institute for Materials Research National Bureau of Standards Washington, D.C. 20234
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Abstract

To study the relationship between crystal growth conditions and resultant crystalline perfection, large nickel single crystals more than 12 cm long and 2 to 3 cm in diameter have been grown from the melt by the Czochralski method. Unlike semiconducting materials, one cannot easily thin metal crystals, without straining them, for the purpose of applying ordinary Lang topography with μL∼l where kinematical scattering in imperfect crystals is a good approximation. This situation with metal crystals necessitates the use of dynamical diffraction effects in imperfect crystals to permit sample crystals to be thick enough to demonstrate their imperfections as in the bulk.

Type
X-Ray Topography
Information
Advances in X-Ray Analysis , Volume 20: Twenty-Fifth Annual Conference on Applications of X-ray Analysis, August 4-6, 1976 , 1976 , pp. 245 - 257
Copyright
Copyright © International Centre for Diffraction Data 1976

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References

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