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The Concept of Pathlength Distributions Applied to Fundamental Parameter Approach
Published online by Cambridge University Press: 06 March 2019
Extract
The fundamental parameter approach for quantitative x-ray fluorescence analysis is an application of the equations derived by Sherman and by Shiraiwa and Fujino. Both derivations assume plane and smooth specimen surfaces and defined entrance and take-off angles of x-rays. Our investigation is dedicated to a more general description of measured characteristic signals. Consequently we have to deal with equations that allow us to account for the parameters mentioned below.
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- Copyright © International Centre for Diffraction Data 1989